SX Primus 400 WDXRF for Very Large Samples
Aug 09 2017 Read 540 Times
Rigaku's unique ZSX Primus 400 sequential wavelength dispersive X-ray fluorescence (WD-XRF) spectrometer was specifically designed to handle very large and/or heavy samples. Accepting samples up to 400 mm diameter, 50 mm thick and 30 kg mass, this system is ideal for analysing sputtering targets, magnetic disks, or for multilayer film metrology or elemental analysis of large samples.
All analytical capabilities of a traditional instrument are retained in this "large sample" variant. Analyse beryllium (Be) through uranium (U) with high-resolution, high-precision WDXRF spectroscopy, from solids to liquids and powders to thin films. Having the versatility to adapt to your specific sample types and analysis needs, this WDXRF spectrometer is adaptable to various sample sizes and shapes using optional (made to order) adapter inserts. With a variable measurement spot (30 mm to 0.5 mm diameter, with 5-step automatic selection) and mapping capability with multi-point measurements to check for sample uniformity, this uniquely flexible instrument can dramatically streamline your quality control processes.
Do you like or dislike what you have read? Why not post a comment to tell others / the manufacturer and our Editor what you think. To leave comments please complete the form below. Providing the content is approved, your comment will be on screen in less than 24 hours. Leaving comments on product information and articles can assist with future editorial and article content. Post questions, thoughts or simply whether you like the content.
In This Edition... Fuel for Thought - A good year for Endress+Hauser - Dr. Shah honoured by Society of Tribologists and Lubrication Engineers - DURAG Group acquire AP2E Analytical Instru...
View all digital editions
Jul 30 2018 Moon Township, PA, USA
Aug 06 2018 Westminster, CO, USA
Aug 09 2018 Madrid, Spain
Aug 27 2018 Stavanger, Norway
Sep 03 2018 Abu Dhabi, UAE