Analytical Instrumentation
New Benchmark for Standardless XRF Analysis
Aug 01 2009
PANalytical (The Netherlands) presents Omnian, the new standardless analysis package. This latest module in the company’s proven SuperQ software suite is designed to be used with the Axios sequential X-ray fluorescence (XRF) spectrometer.
Omnian provides the ideal answer for characterisation and analysis of unknown samples for instance during refining processes, or in situations where certified standards that match specific sample characteristics are not available.
Omnian can handle a wide variety of sample types such as solids, pressed powders, fused beads, loose powders and liquids. The software is adaptable, depending on user experience or the desired mode of operation. With its problem-solving power it deals with analytical challenges including sample quantification, screening and failure analysis, as well as the comparison of different materials.
Omnian is set to become the new benchmark in these important applications. It is designed to provide fast, reliable quantification in the default ‘black box’ mode. However, the data collected is comprehensive and can be reviewed more extensively.
The system adjusts automatically to sample and matrix effects as well as sample thickness, volume and ‘Dark–Matrix’ composition. It can be fine-tuned for increased accuracy by using Adaptive Sample Characterisation (ASC).
Digital Edition
PIN 25.1 Feb/March
March 2024
In This Edition Safety - The technology behind the ION Science Tiger XT - Safety with ammonia and LOHCs as hydrogen carriers Analytical Instrumentation - Discussion on new tribology te...
View all digital editions
Events
Apr 28 2024 Montreal, Quebec, Canada
Apr 30 2024 Birmingham, UK
May 03 2024 Seoul, South Korea
May 05 2024 Seville, Spain
May 06 2024 Riyadh, Saudi Arabia