Better Silicon Detection Counts

XOS (USA) announces its latest product introduction – the Signal analyzer – features XOS’s robust, widely used Monochromatic Wavelength Dispersive X-Ray Fluorescence (MWD XRF) to detect Silicon down to 0.5 ppm with the XOSexclusive advantage of unprecedented precision at the push of a button. Signal effectively eliminates extensive sample preparation associated with ICP while offering better precision in a 10-minute measurement cycle: Placing the sample in a standard XRF sample cup is the only handling required for the measurement. This Silicon quantification capability is available for petroleum matrices, additives and bio-fuels, including ethanol. XOS’s MWD XRF platform technology is also used in the company’s award-winning Sindie and Clora line analyzers to quantify Sulfur and Chlorine in hydrocarbon, aqueous and bio-fuels matrices. “XOS is leading the ASTM D2.03 Task Group for the development of an ASTM standard test method for the Signal technology, and a wide ranging interlaboratory study has been completed in support of this ASTM method development effort,” said Berry Beumer, Vice President of Sales and Marketing at XOS.

MWD XRF uses state-of-the-art focusing and monochromating optics to increase excitation intensity and offers a dramatic improvement of signal-to-background over high-power traditional WD XRF instruments. This enables significantly improved detection limits and enhanced precision from crude oils matrices to bio-fuels. MWD XRF is a direct measurement technique that does not require sample treatment or sample conversion and does not involve high-temperature operations or processing.