Trace Metals Detection by HD XRF

Analytical instrumentation

Trace Metals Detection by HD XRF

20 Jan, 2011

Published over 15 years ago. See the latest and most current information on Analytical instrumentation.

XOS (USA) announces that the HD Maxine, its newest analysis solution for parts-per-billion trace metal analysis in hydrocarbon matrices, offers the XOS-exclusive advantage of one-touch results and unrivaled precision – without extensive sample prep, consumable gasses, and long measurement cycles. The Maxine analyser uses XOS’s state-of-the-art HD XRF technology platform to detect elements from Vanadium to Selenium at sub-ppb concentrations in such applications as crude oil and lubricants. Quantification of 16 critical elements in a 10-minute measurement cycle is a standard Maxine feature, and an auto-sampler with eight sample cells is optionally available to enhance productivity further. And Maxine’s robust configuration and ease-of-use makes it an ideal analysis solution in today’s demanding industrial environments.

HD XRF uses an array of monochromating optics to increase intensity and offer improved signal-to-background over conventional XRF systems. Multiple and select energy beams efficiently excite the target elements in the sample, significantly enhancing precision and detection performance in turn. HD XRF is a direct measurement technique that does not demand sample digestion or conversion or chemicals and yet delivers an unprecedented combination of rapid results and pinpoint accuracy.

PIN 27.2 Apr/May 2026

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