New Tube-Above WDXRF Spectrometer from Rigaku Features Advanced Guidance System and Automatic Application Setup

Wavelength dispersive X- ray fluorescence (WDXRF) analysis is known for high detection sensitivity and spectral resolution offering non-destructive trace element analysis, and is often employed by research institutions and for quality control. The new Rigaku ZSX Primus IV spectrometer is a high-power sequential WDXRF analytical tool for research and development, and for the analysis of advanced materials and products. It leverages recent advancements in data processing using the fundamental parameters method, and delivers rapid quantitative determination of major and minor atomic elements with minimal standards.

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The ZSX Primus IV spectrometer features a tube-above configuration. Due to the tube-above optics, powder sample spills do not adversely affect the optical system. Since no protective film is required, intensity reduction due to film is avoided.

The unit features a 30 micron tube, tube for exceptional light element (low-Z) detection limits. Light element sensitivity is also boosted by the system’s APC (Auto Pressure Control), which regulates and stabilised vacuum conditions. Combined with the most advanced mapping package to detect inclusions and eliminate sampling errors in inhomogeneous materials, the ZSX Primus IV allows easy, detailed investigation of samples that provide analytical insights not readily obtained by other analytical methodologies.

A key new advantage to this system is the new ZSX Guidance 'expert system' software, with a quantitative application auto-configuration feature to set measurement and various correction conditions once the user enters the standard values and sample information.

Throughput is also greatly improved by high-speed sample transportation, high-speed goniometer drive, high-speed data processing and effective driving control.

During analysis, regions of interest can be located in enlarged images of the sample taken with a high-resolution camera. The r-θ sample stage can be accurately positioned to facilitate measurements with uniform sensitivity on these small areas.

Key Features

• Tube-above optics - Contamination risk is minimised because sample spills do not affect the optical system. Intensity reduction is avoided since no protective film is required.
• ZSX Guidance software - Built-in XRF expertise handles sophisticated settings. Available application packages enable quick startup.
• High-speed analysis - Throughput has been greatly improved by high-speed sample transportation, goniometer drive, data processing and effective driving control. Measurement time has been reduced by 40% for qualitative analysis and 20% for quantitative analysis.
• Digital Multi-Channel Analyser (D-MCA) - D-MCA X-ray counting system delivers improved precision with higher counting linearity.
• Point and mapping analysis - Regions of interest can be located in enlarged images of the sample taken with a high-resolution camera. The r-θ sample stage can then be positioned accurately to make measurements with uniform sensitivity on these small areas.
• Gas-sealed proportional counter (S-PC LE) for light elements. An alternative to gas flow proportional counter (F-PC) is optional for sites where P-10 gas is not available.