New 5th Generation Benchtop X-ray Diffraction (XRD) Introduced

2012 heralds the newest additions to the MiniFlex series of benchtop X-ray diffraction (XRD) analysers. The new 5th generation MiniFlex is a general purpose X-ray diffractometer that can perform qualitative and quantitative analysis of polycrystalline materials. MiniFlex is now available in two variations. Operating at 600 W (X-ray tube), the MiniFlex 600 is twice as powerful as other benchtop models, enabling faster analysis and improved overall throughput. Running at 300 W (X-ray tube), the new MiniFlex 300 does not require an external heat exchanger. Each model is engineered to maximise flexibility in a benchtop package.

Ideally suited for today's fast-paced XRD analyses, the new 5th generation MiniFlex delivers speed and sensitivity through innovative technological enhancements such as the optional D/teX Ultra high-speed detector coupled with the new 600 W X-ray source. The optional graphite monochromator, coupled with the standard scintillation counter, maximises sensitivity by optimising peak-to-background ratios. If resolution is paramount, incident and diffracted beam slits can be selected to provide the desired resolution. MiniFlex is the only benchtop XRD system with an available sample changer for high sample throughput. Whether used for teaching X-ray diffraction at the college and university level, or for conducting routine industrial quality assurance, the MiniFlex delivers both performance and value.

Each MiniFlex comes standard with the latest version of PDXL, Rigaku's full-function powder diffraction analysis package. The latest version of PDXL offers important new functionality, including a fundamental parameter method (FP) for more accurate peak calculation, phase identification using the Crystallography Open Database (COD), and a wizard for ab inito crystal structure analysis.

This versatile and powerful instrument brings a broad range of analytical capabilities to bear on common materials analysis applications. From phase identification and quantification to the determination of percent (%) crystallinity and crystallite size and strain, the new MiniFlex excels in routine operations. Even more powerful capabilities, like lattice parameter refinement, Rietveld refinement and powder molecular structure determination, are available.

The original MiniFlex, introduced in 1973, was designed to empower a novice user to produce results with a compact XRD instrument comparable to those obtainable by a trained diffractionist. The new MiniFlex builds upon the characteristics that have made it popular for many years – including compact size and robust design – enabling installation in a small space with easy-to-use operation and very low cost-of-ownership.