Instruments + Software + standards = new solutions at ACHEMA 2009

Leading analytical X-ray company PANalytical (The Netherlands)  reinforced its reputation for complete solutions at this year’s ACHEMA conference and exhibition.

Visitors to hall 6.3, standJ21-K23,  experienced innovative 3-D interactive product simulations showcasing the Axios range of XRF spectrometers. Omnian, PANalytical’s new standardless XRF analysis package for the rapid quantification of unknown samples, made its European exhibition debut, and the company  also featured one of its flexible, cost-effective application-specific MiniPal systems. The instrumentation, software and standards packages  demonstrated complete solutions for elemental analysis in the cement, mining, metals, pharmaceutical, chemical, plastics and oil industries.

A wide range of PANalytical XRD hardware and software was also on show. With applications as diverse as pharmaceuticals and nanomaterials, the X’Pert PRO multi-purpose X-ray diffractometer was also featured. Visitors were able to test PANalytical’s unique PreFIX system for the rapid exchange of all optical components without the need for realignment. The X’Pert PRO system allows an unmatched range of geometries, from the traditional Bragg-Brentano to an ultra-fast transmission high-throughput system with the revolutionary PIXcel detector. It can also accommodate a SAXS setup. Flexible XRD software covers phase analysis, stress and thin film analysis, high-end cluster analysis and small-angle scattering, for example.