Ultra Fast Acquisition of Dynamic Thermal Events

FLIR Systems has launched its new X6580sc thermal imaging camera as a solution for researchers and scientists that require ultra-fast frame rate acquisition of extremely dynamic thermal events.

The X6580sc features a high-speed 640x512 digital InSb detector with broadband (1.5-5.5µm) spectral sensitivity and F/3 aperture. The X6580sc provides images up to 350Hz in full frame and up to 4500 Hz in a 320x8 sub-windowing mode.

The camera can be temperature calibrated up to 300°C, or up to 3000°C with spectral and/or neutral density filters. Measurement accuracy of +/-1°C for standard configurations ensures top quality results.

According to Nigel Peart, FLIR Sales Manager (Northern Europe) for R&D / Science products, “The X6580sc sets a new benchmark for researchers involved with high-speed R&D/Science applications such as material impact shock testing and fast thermal events like exothermal chemical reactions as well as Infrared Signature (Range Test Lab) applications".