High resolution electron microscopy imaging and elemental analysis

JEOL’s Scanning Electron Microscopes (SEM) offer high resolution imaging and elemental analysis, with a range of SEM models from benchtop to ultrahigh resolution field emission systems. JEOL’s new compact, versatile field emission SEM is ideal for a wide variety of materials and is a high-value system for any lab. The new JSM-IT700HR InTouchScope FE SEM is equipped with a large, robust specimen chamber and can be operated in high and low vacuum modes – ideal for specimen observation in its native state. A fully-embedded Energy Dispersive X-Ray Spectroscopy (EDS) system - a chemical microanalysis technique for SEM – provides “Live EDS” analysis in real time.

An exceptionally user-friendly SEM software interface significantly simplifies observation and analysis, especially appreciated by novice as well as experienced users. The user interface is fully remotely operational, allowing additional flexibility. JEOL SEMs feature seamless navigation to areas of interest and simplify acquisition of data from observation to elemental analysis and subsequent reporting. A “Zeromag” function links an optical image, SEM images, and EDS data for an instant map of analysis positions. Expanded functionality includes automated montage, movie capture, and compatibility with Python scripting, live web viewing, and remote control.