Since 1949, the JEOL legacy has been one of outstanding innovation in developing instruments used to advance scientific research and technology. JEOL has 70 years of expertise in the field of electron microscopy, more than 60 years in mass spectrometry and NMR spectroscopy, and more than 50 years of e-beam lithography leadership. JEOL USA, Inc., is a wholly owned subsidiary of JEOL, Ltd., Japan, and was incorporated in the United States in 1962. The company has 13 regional service centers that offer unlimited emergency service and support in the U.S.
Analysers (Elemental)
Analysers (Fuel)
Analysers (Hydrocarbon)
Analysers (Total Petroleum Hydrocarbon)
Analysers (Volatile Organic Compounds - VOCs)
Chromatography (Gas)
Continuous Emission Monitoring Systems
Detectors (Hydrocarbons)
Detectors (Multi - Gas)
Detectors (Organic Vapour)
Detectors (Volatile Organic Compounds - VOC)
Electron Probe Microanalyzers (EPMA)
Image Analysis
Microscope (Electron Scanning- Focused Ion Beam)
Microscope (Electron Scanning)
Microscope (Electron Transmission)
Microscope (Electron)
Microscopy
Monitors (Gas)
Sensors (Gas)
Software (Instrumentation)
Software (Mass Spectrometers)
Spectrometers
Spectrometers (Mass)
Spectrometers (Nuclear Magnetic Resonance - NMR)
Spectrometers (X-Ray Fluorescence - XRF)
PIN 27.3 June/July 2026