High-performance, Direct Excitation Variable Spot EDXRF Elemental Analyser Showcased at Pittcon 2016

Applied Rigaku Technologies, Inc. (USA) has announced its launch of the new Rigaku NEX DE VS direct excitation variable spot X-ray fluorescence (EDXRF) elemental analyser. The instrument debuted at the 66th annual Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy (Pittcon 2016), held Sunday, March 6, 2016 through Thursday, March 10, 2016 at the Georgia World Congress Center in Atlanta, GA USA. The NEX DE VS analyser is the newest addition to the Rigaku NEX DE Series of high-performance, direct excitation EDXRF elemental analysers.

Each instrument in the NEX DE series is equipped with a 60 kV, 12 W X-ray tube and a high-throughput Si drift detector. This detector supports count rates in excess of 500K cps, resulting in low limits of detection. The instruments were designed for demanding applications or for situations where analysis time or sample throughput is critical, and is suitable for a broad range of applications, including exploration, research, bulk RoHS inspection, and education, as well as industrial and production monitoring applications.

The NEX DE VS analyser is uniquely suited for small spot analysis applications. It features a high resolution

camera combined with automated collimators allowing for precise positioning of a sample for the analysis of 1 mm, 3 mm, and 10 mm spot sizes. These features, combined with the advanced Rigaku QuantEZ analytical software, provide unparalleled performance for both bulk and small spot analysis in a single instrument.