Oxford Instruments (UK) announces the launch of a robust X-ray Fluorescence (XRF) analyser – the X MET5000, for highly accurate and reliable elemental analysis. The X MET5000 represents the 4th generation of Oxford Instruments` world-renowned XRF hand-held analysers.
Engineered for high performance and reliability, this brand new analyzer combines Oxford Instruments` patented PentaFET® detector technology offering guaranteed fast analysis and lower detection limits for all elements of interest.
Purpose-built for the most demanding quality control applications: scrap
metal recycling, analysis of metals for PMI, screening for lead in toys and consumer products for RoHS compliance testing. The X-MET5000 also serves the needs of the mining community for ore exploration, as well as the measurement of heavy metals in soils for environmental monitoring.
The X-MET5000`s major strength is the Light Element Treatment (LET) mode, enabling fast and accurate analysis of heavy elements, even when the sample contains light elements like Aluminum and Silicon. This is not possible when using Fundamental Parameters (FP) on an analyzer that does not detect the light elements.
This rugged and reliable tool is IP54 (NEMA 3) approved for superior dust and splash protection. The X-MET5000 is perfect for the harshest environments.
The battery`s operating time of one working day enables extended
productivity. The powerful user programmable software delivers highly
accurate results for reliable Go/No-Go decisions. The X-MET5000 will identify material type and automatically choose the best analysis method.
An optional bench-top stand enables hands-free operation for multi-tasking without the loss in confidence in measurement results.
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