Analytical Instrumentation

  • Analysis of Toxic Metals and TOC in Process and Waste Waters of the Petrochemical Industry

Analysis of Toxic Metals and TOC in Process and Waste Waters of the Petrochemical Industry

Oct 30 2017 Read 707 Times

The petroleum industry generates large volumes of waste water or effluents that must be treated before it can be reused or released into natural waterways. Wastewater pollution can affect drinking water and ground water supplies, thereby endangering human health, affecting crop production and aquatic life as well as the natural environment.

Toxic heavy metals like Cadmium, Chromium, Lead and Mercury are typically monitored in process waters, effluents and waste water of petrochemical plants by Atomic Absorption Spectroscopy, ICP-OES or ICP-MS. Moreover, the total organic carbon content (TOC) is routinely determined as organic acids for example contribute to the mobilization of heavy metals into lower soil layers and ground water via complexation. However, for all these techniques high concentrations of total dissolved solids (TDS) often hamper the direct analysis of waste water samples.

At PEFTEC (www.peftec.com) in Antwerp, on November 29 – 30, 2017 Analytik Jena reports analytical approaches for the analysis of toxic trace metals and TOC that reduce sample handling and carry-over effects. During the conferences, poster presentation and at booth #32 Analytik Jena presents its most recent developments for high performance solutions in oil and petrochemical business:

Oral presentations: PlasmaQuant® PQ 9000 - Optical Emission Spectroscopy
Wednesday, November 18, 2015 at 10:00 am to 10:30 am, Seminar Room 2:
„PlasmaQuant PQ 9000: Advances in the Analysis of Heavy Oils by High-Resolution ICP Optical Emission Spectrometry" multi EA® 5000 – Micro-Elemental Analysis (C, N, S, Cl): Wednesday, November 18, 2015 at 2:30 pm to 3:00 pm, Seminar Room 6: "multi EA 5000: Heavy fuel oil and other challenging matrices - Strategies for the Easy and Reliable determination of Sulfur in presence of N-compounds"

Poster presentation: multi EA® 5000 - Micro-Elemental Analysis (C, N, S, Cl):
Presenter will be present at lunch break from 12:30 pm to 2:00 pm on both days
“Sulfur Trace Analysis - Reliable Determination in Presence of Interferences”

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