New Silicon Drift Detector for EDXRF Elemental Analyser Enables Faster Analysis With Better Limits of Detection
Dec 11 2015 Read 716 Times
Designed to dramatically improve elemental analysis capabilities for a broad range of applications, the new SDD1000 detector for the Thermo Scientific (USA) ARL QUANT’X EDXRF spectrometer utilises a 1,000-micron silicon crystal, more than double the thickness of silicon drift detectors on the market. The multi-purpose ARL QUANT’X EDXRF (energy dispersive x-ray fluorescence) spectrometer fitted with the SDD1000 detector provides four times higher count rate and better resolution than the instrument’s previous detector, offering improved limits of detection and three times faster measurement. The thickness of the state-of-the-art silicon crystal provides enhanced sensitivity for the detection of heavy elements. Its larger active area provides better performance for lighter to heavier elements.
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