DIAL for Emissions Monitoring. Optical Gas Imaging for Fugitive Emissions. Stack Gas and Energy Gas measurement standards.

Sponsors


NPL

ExxonMobil Research and Engineering Company

VSL Dutch Metrology Institute


Date: 15:35:00 - Nov 18 2015
Speakers: Mr Fabrizio Innocenti, Petroula Kangas, Janneke van Wijk
Moderators: Rod Robinson

The Application of Differential Absorption Lidar (DIAL) for Pollutant Emissions Monitoring - Mr Fabrizio Innocenti

This talk will describe the Differential Absorption Lidar (DIAL) Technique and explain how it can be used to measure and quantify fugitive emissions of hydrocarbons from refineries and the petrochemical industry. The identification and quantification of fugitive emissions from industrial sites is becoming increasingly important from a regulatory and environmental standpoint and DIAL is one of the techniques recognised as Best Available Technology in the refining BREF.

New Optical Gas Imaging Technology for Quantifying Fugitive Emission Rates - Mrs Petroula Kangas

The foundation of Leak Detection and Repair (LDAR) programs in many regions globally is Method 21, which was promulgated by the U.S. EPA to screen equipment components for potential fugitive emissions. Method 21 uses screening values and empirical relationships developed from field test data to estimate (not measure) the mass rate of fugitive emissions using concentration data measured near the potentially leaking component. Because Method 21 is very labor intensive, compliance with LDAR requirements can be very costly. Optical gas imaging (OGI) technology offers significant productivity improvements that could reduce considerably costs for LDAR compliance. Despite the potential for these cost savings, OGI technology has not been adopted by regulatory agencies for LDAR as a replacement for Method 21 because it has not been considered to be sufficiently quantitative.

New developments in Stack Gas and Energy Gas measurement standards at VSL - Mrs Janneke van Wijk

VSL, the Dutch Metrology Institute, is among the leading national metrology institutes worldwide that provide metrological traceability and quality assurance for measurements of all kinds of energy and emission gases. Primary gaseous reference materials for refinery gas mixtures, sulphur components in methane and stack gas mixtures are constantly improved, both in available ranges and components.

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Speakers


Mr Fabrizio Innocenti
Mr Fabrizio Innocenti (NATIONAL PHYSICAL LABORATORY)

Petroula Kangas
Petroula Kangas (ExxonMobil Research and Engineering Company)

There are plenty of diverse opportunities in professional life. First learn about yourself and understand the culture of the company you are working for, then identify the area you enjoy most and you feel you can best contribute… and then go for it!

Janneke van Wijk
Janneke van Wijk (VSL Dutch Metrology Institute)

Moderators


Rod Robinson
Rod Robinson (NATIONAL PHYSICAL LABORATORY)

Rod is an international authority on industrial emissions measurements and is on the Management Board of the UK's Source Testing Association. He has previously been the Quality Officer and Chairman. He consults for the UK Environment Agency in this context, and has been invited to give a keynote presentation at the last four annual conferences of the US Source Evaluation Agency.


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