New Benchtop EDXRF for Elemental Analysis

As a premium low cost benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyser, the Rigaku NEX QC+ QuantEZ delivers wide elemental coverage with an easy-to-learn Windows®-based QuantEZ software with available standardless FP. Non-destructively analyse from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids and slurries.

Powerful Windows® based QuantEZ software
QuantEZ analytical software was specifically designed for the Rigaku NEX QC+ QuantEZ benchtop EDXRF analyser. Running under the Microsoft® Windows® operating system, on either a laptop or benchtop personal computer (PC), the software offers all the functions required for calibration and routine operation. Rigaku has developed software that is not only user-friendly, but sophisticated and powerful enough for the most complex analysis. Based on the famous Rigaku easy-to-use flow bar interface, QuantEZ software walks the user through steps required to set up either an empirical or fundamental parameters application.

Elemental analysis in the field, plant or lab
Especially designed and engineered for heavy industrial use, whether on the plant floor or in remote field environments, the superior analytical power, flexibility and ease-of-use of the NEX QC+ QuantEZ series add to its broad appeal for an ever expanding range of applications, including exploration, research, bulk RoHS inspection, and education, as well as industrial and production monitoring applications. Whether the need is basic quality control (QC) or its more sophisticated variants - such as analytical quality control (AQC), quality assurance (QA) or statistical process control like Six Sigma - the NEX QC QuantEZ series is the reliable choice for routine elemental analysis.

50kV X-ray tube and SDD detector
The shuttered 50kV X-ray tube and Peltier cooled Silicon Drift Detector (SDD) deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides a wide range of XRF applications versatility and low limits-of-detection (LOD).

Options: autosampler, helium and FP
Options include standardless RPF-SQX fundamental parameters, automatic sample changer, sample spinner and helium purge for enhanced light element sensitivity.